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Agilent N1021B, Keysight N1021B, HP N1021B
Differential TDR Probe Kit, 18 GHz

Oscilloscopes >> Accessories and Other >> Differential TDR Probe Kit, 18 GHz
Rent Used Test Equipment
Manufacturer: Keysight / Agilent / HP
Model: N1021B

Keysight / Agilent N1021B Differential TDR Probe Kit, 18 GHz

Electronic Test and Measurement Equipment

Keysight / Agilent N1021B Differential TDR Probe Kit, 18 GHz Product Datasheet Download Product Datasheet

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Product Overview

KEYSIGHT N1021B (Agilent)

The Keysight N1021B is an ergonomically designed handheld probe to interface TDR/TDT modules such as the 54754A to printed circuit boards (PCBs) and components that lack common coaxial high-frequency connectors. The built-in wheel adjusts the pitch between the differential tips to make good contact to pads or access points spaced from closed to typical IC pins (2.54 mm).

Engineers working on high-speed differential electrical channels can analyze where the device under test (DUT) causes reflections that unfavorably affect the signal integrity (SI) of their designs. Manufacturers of printed circuit boards (PCB) can control process consistency from batch to batch, and/or locate the position of shorts, opens or other flaws.

The Keysight N1021B (Agilent) probe is used in conjunction with the following: a) the industry-standard 86100C Infiniium DCA-J Wideband Oscilloscope Mainframe, b) the 86100C-202 Enhanced Impedance and S-Parameter Software, and c) the 54754A Differential & Single-ended TDR-TDT Module. The N1021B probe launches small electrical steps in the DUT (device under test) and/or receives the response, which is processed and displayed in the time domain or as S-parameters (SDD11, SDD22, SDD21 or SDD22). Time-domain measurements can display the reflected voltages or observed impedances versus time or distance. S-parameter measurements include magnitude, phase and group delay.

Features and Specifications of the Keysight N1021B (Agilent)

  • Bandwidth 18 GHz
  • 100 Ohm nominal differential impedance
  • Variable tip spacing: 0.0-2.54mm
  • Spring loaded probe tips with independent Z-axis movement

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