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KEITHLEY 4200-SCS
The Keithley 4200-SCS Semiconductor Characterization System performs lab grade DC and pulse device characterization, real-time plotting, and analysis with high precision and sub-fem to amp resolution. The Keithley 4200-SCS offers the most advanced capabilities available in a fully integrated characterization system, including a complete, embedded PC with Windows operating system and mass storage. Its self-documenting, point-and-click interface speeds and simplifies the process of taking data, so users can begin analyzing their results sooner. Additional features enable stress-measure capabilities suitable for a variety of reliability tests as well as provide precision measurement and high resolution with LCR meter support.
Features of the Keithley 4200 system include:
Testimonials |
Axiom Test has an excellent range of test equipment and is always super responsive to short notice requests. They are an extension of our quality and engineering team with the support they provide us. Thanks! -- Eric G. Phoenix, AZ |