Rent or Buy Keithley 4200-SCS Semiconductor Parameter Analyzer Characterization System

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Keithley 4200-SCS
Semiconductor Parameter Analyzer Characterization System

Component Analyzers, LCR, Semiconductor >> Semiconductor Parameter Analyzers >> Semiconductor Parameter Analyzer Characterization System
Rent Used Test Equipment
Manufacturer: Keithley
Model: 4200-SCS

CLICK TO ENLARGE Keithley 4200-SCS Semiconductor Parameter Analyzer Characterization System

Electronic Test and Measurement Equipment

Keithley 4200-SCS Semiconductor Parameter Analyzer Characterization System Product Datasheet Download Product Datasheet

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Available Option Configurations


  • 2X 4200-SMU - Two 4200-SMU Medium Power SMU Cards
  • 2X 4205 - Remote Bias Tee
  • 4200-PA - Remote Preamp
  • 4200-SCP2HR - Dual Channel DSO Hi Resolution
  • 4205-PG2 - Dual-channel Pulse Generator Card
  • 4210-SMU - High Power Source-Measure Unit
  • MSRP: $85,979 | In Stock!    GET QUOTE  

Product Overview


The Keithley 4200-SCS Semiconductor Characterization System performs lab grade DC and pulse device characterization, real-time plotting, and analysis with high precision and sub-fem to amp resolution. The Keithley 4200-SCS offers the most advanced capabilities available in a fully integrated characterization system, including a complete, embedded PC with Windows operating system and mass storage. Its self-documenting, point-and-click interface speeds and simplifies the process of taking data, so users can begin analyzing their results sooner. Additional features enable stress-measure capabilities suitable for a variety of reliability tests as well as provide precision measurement and high resolution with LCR meter support.

Features of the Keithley 4200 system include:

  • Intuitive, point-and-click Windows®-based environment
  • Unique Remote PreAmps extend the resolution of SMUs to 0.1fA
  • C-V instrument makes C-V measurements as easy as DC I-V
  • Pulse and pulse I-V capabilities for advanced semiconductor testing
  • Scope card provides integrated scope and pulse measure functionality
  • Self-contained PC provides fast test setup, powerful data analysis, graphing and printing, and on-board mass storage of test results
  • Unique browser-style Project Navigator organizes tests by device type, allows access to multiple tests, and provides test sequencing and looping control
  • Built-in stress/measure, looping, and data analysis for point-and-click reliability testing, including five JEDEC compliant sample tests
  • Integrated support for a variety of LCR meters, Keithley switch matrix configurations, and both Keithley Series 3400 and Agilent 81110 pulse generators
  • Includes software drivers for leading analytical probers


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