Agilent 4155C, Keysight 4155C, HP 4155C Rental, Repair, Rent, Used

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Agilent 4155C, Keysight 4155C, HP 4155C
Semiconductor Parameter Analyzer

Component Analyzers, LCR, Semiconductor >> Semiconductor Parameter Analyzers >> Semiconductor Parameter Analyzer
Rent Used Test Equipment
Manufacturer: Keysight / Agilent / HP
Model: 4155C

Keysight / Agilent 4155C Semiconductor Parameter Analyzer

Electronic Test and Measurement Equipment

Keysight / Agilent 4155C Semiconductor Parameter Analyzer Product Datasheet Download Product Datasheet

Rent Test Equipment

Available Option Configurations


  • No Options Included
  • MSRP: $40,743 | In Stock!    GET QUOTE  

Product Overview

RENT AGILENT / HP 4155C Parameter Analyzer (call for availability)

The Agilent / HP 4155C Semiconductor Parameter Analyzer is a cost-effective, accurate laboratory bench top solution for advanced device characterization.

Features and Specifications of the Agilent / HP 4155C Analyzer include:

General Features:


  • Cost-effective, accurate laboratory bench top parameter analyzer
  • 4x Medium-power SMU, 2xVSU and 2xVMU
  • Fill-in-the blanks front panel operation
  • Includes Desktop Easy EXPERT software for PC-based GUI instrument control

Measurement Capabilities:


  • 10 fem-to-amp and 0.2 microvolt measurement resolution
  • QSCV, Stress Mode, Knob-sweep, and Stand-by functions
  • +/- 200 Volts and +/- 1 Amp High-Power SMU, Pulse Generator capabilities available by optional 41501B
  • SMU Measurement Resolution:
    • Voltage: 2 µV
    • Current: 1 fA
  • SMU Measurement Accuracy:
    • Voltage: 200 µV
    • Current: 20 fA
    • SMU pulse width: 500 µs/100 ms
  • VMU:
    • Resolution: 2 µV
    • Accuracy: 200 µV
  • VMU (differential)
    • Resolution: 0.2 µV
    • Accuracy: 10 µV
  • Dual High Voltage Plus Generator
    • Voltage range: +/- 40V
    • Output current: +/- 200 mA
    • Minimum pulse width: 1 µs
    • Minimum pulse period: 2 µs



  • Intuitive, task-oriented approach to parametric test
  • Furnished with over 80 pre-defined, user-modifiable application tests
  • Automatically save data to hard disk drive or any networked drive
  • Offline data analysis and application test development via Desktop EasyEXPERT software

Other Semiconductor Parameter Analyzers

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