Keithley 4200-SCS
Semiconductor Parameter Analyzer Characterization System

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Product Overview

KEITHLEY 4200-SCS

The Keithley 4200-SCS Semiconductor Characterization System performs lab grade DC and pulse device characterization, real-time plotting, and analysis with high precision and sub-fem to amp resolution. The Keithley 4200-SCS offers the most advanced capabilities available in a fully integrated characterization system, including a complete, embedded PC with Windows operating system and mass storage. Its self-documenting, point-and-click interface speeds and simplifies the process of taking data, so users can begin analyzing their results sooner. Additional features enable stress-measure capabilities suitable for a variety of reliability tests as well as provide precision measurement and high resolution with LCR meter support.

Features of the Keithley 4200 system include:

• Intuitive, point-and-click Windows®-based environment
• Unique Remote PreAmps extend the resolution of SMUs to 0.1fA
• C-V instrument makes C-V measurements as easy as DC I-V
• Pulse and pulse I-V capabilities for advanced semiconductor testing
• Scope card provides integrated scope and pulse measure functionality
• Self-contained PC provides fast test setup, powerful data analysis, graphing and printing, and on-board mass storage of test results
• Unique browser-style Project Navigator organizes tests by device type, allows access to multiple tests, and provides test sequencing and looping control
• Built-in stress/measure, looping, and data analysis for point-and-click reliability testing, including five JEDEC compliant sample tests
• Integrated support for a variety of LCR meters, Keithley switch matrix configurations, and both Keithley Series 3400 and Agilent 81110 pulse generators
• Includes software drivers for leading analytical probers