Agilent 4142B, Keysight 4142B, HP 4142B Rental, Repair, Rent, Used


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Agilent 4142B, Keysight 4142B, HP 4142B
Modular DC Source / Monitor Mainframe

Component Analyzers, LCR, Semiconductor >> Semiconductor Parameter Analyzers >> Modular DC Source / Monitor Mainframe
Rent Used Test Equipment
Manufacturer: Keysight / Agilent / HP
Model: 4142B

Keysight / Agilent 4142B Modular DC Source / Monitor Mainframe

Electronic Test and Measurement Equipment

Keysight / Agilent 4142B Modular DC Source / Monitor Mainframe Product Datasheet Download Product Datasheet

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Available Option Configurations

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  • MSRP: $16,220 | In Stock!    GET QUOTE  

Product Overview

The Agilent / HP 4142B Modular DC Source / Monitor Mainframe features flexible, modular architecture, pulse measurement capabilites, high-speed measurement, eight plug-in module slots, SMU, HCU, HVU, VS/VMU, AFU, enhance throughput, and a program memory >2000 commands.

The Agilent/ HP 4142B Modular DC Source/Monitor Mainframe is a system-use dc measurement instrument especially designed for high-throughput dc semiconductor testers. A completely user-definable system component, the Agilent / HP 4142B features modular architecture that allows you to build a custom configuration to suit your measurement needs.

Eight plug-in module slots can accommodate any combination of modules. Choose from two types of source/monitor units (SMUs) to force or measure up to ±200 V and ±1 A: a high-current source/monitor unit (HCU) up to ±10 A, a high voltage source/monitor unit (HVU) up to ±1000 V, a voltage source/voltage monitor unit (VS/VMU), and an analog feedback unit (AFU). The Agilent / HP 4142B's instrument command and measurement data storage capabilities, coupled with the high-speed HP-IB interface, minimize computer loading, enhance throughput, and simplify systemization.

Features and Specifications of the Agilent / HP 4142B Source / Monitor Mainframe include:
  • Flexible, modular architecture
  • Wide measurement range with high resolution
  • V: ±4 µV to ±1000 V, 0.05%
  • l: ±20 fA to ±10 A, 0.2%
  • Pulse measurement capabilities
  • Pulse width 1 ms to 50 ms, 100 µs resolution
  • High-speed measurement (typical)
  • Sourcing or monitoring: 4 ms
  • Vth, hFE extracting: 12 ms
  • Internal memory
  • Program memory: >2000 commands (typical)
  • Data memory: 4004 measurement points

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Phone: (760) 806-6600