Stanford Research SR760
FFT Spectrum Analyzer, 100 kHz

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Product Overview

RENT STANFORD RESEARCH SYSTEMS SR760 FFT Spectrum Analyzer (call for availability)

The Stanford Research Systems (SRS) SR760 is a single-channel 100 kHz FFT spectrum analyzer with a dynamic range of 90 dB and a real-time bandwidth of 100 kHz. The speed and dynamic range of this analyzer, coupled with its flexibility and many analysis modes, makes it the ideal choice for a variety of applications including acoustics, vibration, noise measurement and general electronic use.

• DC to 100 kHz bandwidth
• 90 dB dynamic range
• Harmonic, band and sideband analysis
• 100 kHz real-time bandwidth
• Hardcopy output to printers and plotters
• GPIB and RS-232 interface
• Frequency:
• Measurement Range:  476 µHz to 100 kHz
• Spans:  191 mHz to 100 kHz in a binary sequence
• Center Frequency:  Anywhere within the 0 to 100 kHz measurement range
• Accuracy:  25 ppm from 20 °C to 40 °C
• Resolution:  Span/400
• Window Functions:  Blackman-Harris, Hanning, Flat-Top and Uniform
• Real-time Bandwidth:  100 kHz
• Signal Input:
• Number of Channels:  1
• Input:   Single-ended or differential
• Input Impedance:  1 MO, 15 pF
• Coupling:  AC or DC
• CMRR (at 1 kHz):
• 90 dB (input range
• 80 dB (input range
• 50 dB (input range =14 dBV)
• Noise:
• Typ:  5 nVrms/vHz at 1 kHz (-166 dBVrms/vHz)
• Max:  10 nVrms/vHz (-160 dBVrms/vHz)
• Amplitude:
• Full-Scale Input Range:  -60 dBV (1.0 mVp) to +34 dBV (50 Vp) in 2 dB steps
• Dynamic Range:  90 dB (typ)
• Harmonic Distortion:  No greater than -80 dB from DC to 100 kHz (input range 0 dBV)
• Spurious:  No greater than -85 dB below full scale below 200 Hz. No greater than -90 dB below full scale to 100 kHz (input range -50 dBV).
• Input Sampling:  16-bit A/D at 256 kHz
• Accuracy:  ±0.3 dB ± 0.02 % of full scale (excluding windowing effects)
• Averaging:  RMS, Vector and Peak Hold. Linear and exponential averaging up to 64k scans.
• Trigger Input:
• Modes:  Continuous, internal, external, TTL
• Internal Level:  Adjustable to ±100 % of input scale. Positive or negative slope.
• Min Trigger Amplitude:  10 % of input range
• External Level:  ±5 V in 40 mV steps. Positive or negative slope. 10 kO Impedance
• Min Trigger Amplitude:  100 mV
• External TTL:  Requires TTL level, (low 2 V)
• Post-Trigger:  Measurement record is delayed by 1 to 65,000 samples (1/512 to 127 time records) after the trigger. Delay resolution is 1 sample (1/512 of a record).
• Pre-Trigger:  Measurement record starts up to 51.953 ms prior to the trigger. Delay resolution is 3.9062 ms.
• Phase Indeterminacy:  <2°        
• Display Functions:
• Display:  Real, imaginary, magnitude or phase
• Measurements:  Spectrum, power spectral density, time record and 1/3 octave
• Analysis:  Band, sideband, total harmonic distortion and trace math
• Graphic Expand:  Display expand up to ×50 about any point
• Harmonic Marker:  Displays up to 400 harmonics
• Data Tables:  Lists Y values of up to 200 points
• Limit Tables:  Detects data exceeding up to 100 user-defined upper and lower limit trace segments.
• General:
• Monitor:  Monochrome CRT. 640H by 480V resolution. Adjustable brightness and position.
• Interfaces:  IEEE-488.2, RS-232 and Printer interfaces standard. An XT keyboard input is provided for additional flexibility.
• Hardcopy:  Screen dumps and table and setting listings to dot matrix and LaserJet compatible printers. Data plots to HP-GL compatible plotters (RS-232 or IEEE-488.2).
• Disk:  3.5" DOS compatible format, 1.44 Mbyte (720 kbyte for the SR760) capacity. Stores data and instrument configurations.
• Power:  60 W, 100/120/220/240 VAC, 50/60 Hz

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