Tektronix TDP3500
Differential Probe, 3.5 GHz

The Tektronix TDP3500 Probe is a Differential-ended Active probe that provides truer signal reproduction and fidelity for high-frequency measurements. It also provides high-speed electrical and mechanical performance required for today's digital system designs. The Tektronix TDP3500 Probe is designed specifically for use, and direct connection to, Tektronix oscilloscopes with the TekVPI™ probe interface.

Features and Specifications of the TDP3500 Differential Probe include:

• Features:
  • Outstanding electrical performance:
    • Bandwidth that provides accurate measurements for serial and digital applications
    • Excellent common mode rejection that reduces measurement errors in higher common environments
    • Low capacitive and resistive loading:
      • Maintains signal fidelity
      • Reduces DC biasing interactions
  • Versatile mechanical performance:
    • Compact probe head size for probing small geometry circuit elements
    • DUT attachment accessories enable connection to fine-spaced SMDs
    • Robust design for reliability
  • Connects directly to oscilloscope with the TekVPI™ probe interface
  • Provides automatic units scaling and readout on the oscilloscope display
  • Embeds the probe characteristics within the oscilloscope
  • Easy access to probe comp box controls or oscilloscope probe menu display for:
    • probe status
    • probe setup control
    • diagnostic information
  • Integrated Scope/Probe System:
    • Direct connection to and powered from the TekVPI™ Oscilloscope Interface without the need of an external power supply
    • Single-button oscilloscope probe menu access
    • Setup and control from comp box or oscilloscope user interface
    • AutoZero:  Zeros out output offset
    • Remote GPIB/USB probe control through the oscilloscope
  • Applications:
    • Design, validation, degugging, and characterization of common high-speed serial bus designs:
      • I²C
      • CAN/LIN
      • SPI
      • Serial ATA
      • Ethernet (GbE)
      • USB 2.0
      • Firewire (1394b)
    • Signal integrity, jitter, and timing analysis
    • Manufacturing, engineering and test
• Specifications:
  • Probe Bandwidth:  ≥3.5 GHz warranted
  • Probe Attenuation:  5x
  • Probe Rise Time:  ≤110 ps typical
  • Differential Input Capacitance:  ≤0.3 pF
  • Differential Input Resistance:  100 kΩ
  • Differential Input Dynamic Range:  ±2 V
  • CMRR:
    • >60 dB at 1 MHz
    • >25 dB at 1 GHz
  • Input Offset Range: ±1 V displayed
  • Operation Voltage Input Range (Common Mode Input Range):  +5 V to -4V
  • Noise:  ≈35 nV/root Hz
  • Max Input Voltage (Nondestruct):  ±15 V (DC + pk AC)
  • Propagation Delay:  5.4 ns typical