Keithley 2651A
High Power SourceMeter, 2000W Pulse, 200W DC, 100 fA, 40V, 20A DC/50A Pulse

Meters >> SourceMeters >> High Power SourceMeter, 2000W Pulse, 200W DC, 100 fA, 40V, 20A DC/50A Pulse





Download Product Datasheet

Available Option Configurations

Config-01

• No Options Included
• MSRP: $26,000
• Available for Rental    GET QUOTE  

Product Overview

The high power Keithley 2651A  SourceMeter is specifically designed to characterize and test high power electronics and it can help you improve productivity in applications across the R&D, reliability, and production spectrums, including high brightness LEDs, power semiconductors, DC-DC converters, batteries, and other high power materials, components, modules, and subassemblies.

The Keithley  2651A SourceMeter offers a highly flexible, four quadrant voltage and current source/load coupled with precision voltage and current meters. It can be used as a:

• Semiconductor characterization instrument
• V or I waveform generator
• V or I pulse generator
• Precision power supply
• True current source
• Digital multimeter (DCV, DCI, ohms, and power with 5½-digit resolution)
• Precision electronic load

Features and Specifications of the Keithley 2651A System SourceMeter include:

• Source or sink:
  • 2,000W of pulsed power (±40V, ±50A)
  • 200W of DC power (±10V@±20A, ±20V@±10A, ±40V@±5A)
  • Up to 50A @ 40V with pA and uV Resolutiion
• Easily connect two units (in series or parallel) to create solutions up to ±100A or ±80V
• 1pA resolution enables precise measurement of very low leakage currents
• 1µs per point (1MHz), continuous 18-bit sampling, accurately characterizes transient behavior
• 1% to 100% pulse duty cycle for pulse width modulated (PWM) drive schemes and device specific drive stimulus
• Combines all in one instrument:
  • a precision power supply
  • current source
  • DMM
  • arbitrary waveform generator
  • V or I pulse generator
  • measurement
  • electronic load
  • and trigger controller
• Ability to be used as either a bench-top I-V characterization tool or as a building block component of multiple-channel I-V test systems
• TSP Express software to quickly and easily perform common I-V tests without programming or installing software
• LabVIEW® driver
• ACS Basic Edition software for semiconductor component characterization (optional). ACS Basic now features a Trace mode for generating a suite of characteristic curves.
• Keithley’s Test Script Processor (TSP®):
  • enables creation of custom user test scripts to further automate testing
  • supports the creation of programming sequences that allow the instrument to operate asynchronously without direct PC control
• Parallel test execution and precision timing when multiple Series 2600A instruments are connected together in a system
• LXI class C compliance
• 14 digital I/O lines for direct interaction with probe stations, component handlers, or other automation tools
• USB port for extra data and test program storage via USB memory device
• Applications:
  • Power semiconductor, HBLED, and optical device characterization and testing
  • Characterization of GaN, SiC, and other compound materials and devices
  • Semiconductor junction temperature characterization
  • High speed, high precision digitization
  • Electromigration studies
  • High current, high power device testing