The Keithley 7072 Semiconductor Matrix Card is designed specifically to handle low-level and high-impedance measurements encountered in semiconductor parametric tests on wafers and devices. This unique design provides two low-current circuits with specified 1pA maximum offset current for sensitive sub-picoamp measurement resolution and two C-V paths for measurement of Capacitance Voltage characteristics from DC to 1MHz. Four additional high-quality signal paths with
Features and Specifications of the Keithley 7072 includes:
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