Rent or Buy Boonton 7200 Capacitance Meter



Tektronix Encore




Boonton 7200
Capacitance Meter

Component Analyzers, LCR, Semiconductor >> Impedance, Capacitance and LCR >> Capacitance Meter
Rent Used Test Equipment
Manufacturer: Boonton
Model: 7200

Boonton 7200 Capacitance Meter

Electronic Test and Measurement Equipment

Boonton 7200 Capacitance Meter Product Datasheet Download Product Datasheet

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Available Option Configurations

Config-01

  • No Options Included
  • MSRP: $7,495 | In Stock!    GET QUOTE  

Product Overview

RENT BOONTON 7200 Capacitance Meter (Call for Availability)

 

The Boonton 7200 is a sophisticated capacitance meter equally suited for demanding R&D, as well as manufacturing applications. Two phase-sensitive detectors are used to extract and display both the parallel capacitance and conductance of the device under test. From the measured parameters the 7200 can calculate and display the equivalent parallel and series resistance, series capacitance, dissipation factor, and quality factor Q. Capacitance can also be displayed as a deviation from a selectable reference standard in % or pF units. The 7200 uses a software filter technique which averages consecutive measurements to achieve a stable display value.

Test levels are programmable from 15 to 100 mV, making the Boonton 7200 suitable for a wide variety of semiconductor measurements. Up to 99 complete front panel setups can be stored and recalled in internal non-volatile memory. A variety of special functions are provided to extend the operation of the 7200 to meet specific requirements. For example, the instrument can be forced to hold a particular measurement or bias range. The averaging filter length can be selected from no averaging up to 500 measurements. Special functions can also be used, in conjunction with external standards, to calibrate the instrument from the front panel or over the ieee-488 interface.

 

Specifications for the BOONTON 7200 Capacitance Meter Include:

Capacitance range 0 to 2000 pF
Conductance range 0 to 2000 µS
Test frequency 1 MHz crystal-controlled
Internal bias ±60 V

 

See Datasheet for full specifications

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