RENT Microsemi 5125A (call to schedule availability)
The Microsemi 5125A Phase Noise and Allan Deviation (ADEV) Test Set with Ultra Low Noise Floor transforms the way these measurements are made. Traditional measurement instruments require an external phase-lock loop, turning these types of measurements into a complicated and costly endeavor. Compare this with the 5125A, which makes fast yet accurate single sideband (SSB) phase noise and ADEV measurements at the click of a button, all at a fraction of the cost of alternative solutions.
The 5125A employs both direct sampling of the RF waveforms as well as cross correlation, making it possible to easily characterize the highest performance time and frequency references. The third generation, all-digital 5125A has been designed to meet the most demanding requirements. The 5125A can measure phase noise down to -145 dBc/Hz at 1 Hz offset from a 10 MHz carrier and -130 dBc/Hz at 1 Hz offset from a 100 MHz carrier, making it the perfect solution to characterize the very low noise frequency references, such as those used in RADAR and satellite communications.
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