Agilent N7788B, Keysight N7788B, HP N7788B
Optical Component Analyzer

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Product Overview

KEYSIGHT N7788B

The Keysight N7788B Component Analyzer uses proprietary technology to push the limits of today's optical technology. The Keysight N7788B is comparable with the well-known Jones-Matrix-Eigenanalysis (JME) which is the standard method for measuring Polarization Mode Dispersion (PMD) or differential group delay (DGD) of optical devices.

The new single scan technology from Keysight, offers a range of advantages to test a complete set of parameters including:

• DGD/ PMD
• PDL
• Power / Loss
• TE / TM-Loss
• 2nd-order PMD
• Principal States of Polarization (PSPs)
• Jones and Mueller Matrices

Features of the N7788B Optical Component Analyzer include:

• High throughput: A complete analysis across the C and the L band is performed in less than 10 seconds
• Software Drivers: A range of software drivers is available for external control of the system. This allows easy integration in common ERP systems.
• Remote control: Control of the instrument through LAN or via the Internet is supported. This supports automation as well as trouble shooting.
• Report Generation: Generating PDF reports is supported. The content including layout is configurable by the user.
• Real time power readout: High throughput measurement of non-connectorized components is supported by providing a real time power readout which enables fiber coupling of the new device.
• Barcode Scanner: Using Barcode scanner is supported for quick transfer of the DUT serial number.

Specifications of the Keysight N7788B include:

Wavelength (must select appropriate option at time of order):

• 1270 nm to 1375 nm (Opt. 300, O-Band)
• 1270 nm to 1375 nm, 1460 nm to 1620 nm (Opt. 400, O/C/L-Band)
• 1460 nm to 1620 nm (Opt. 500, C/L-Band)
• Operating wavelength range: 1260 nm to 1640 nm (SOP/DOP measurements are only possible outside the specification wavelength range if the user performs a manual calibration).

Differential group delay

• DGD uncertainty
• Resolution 2.0 nm ± (30 fs + 3.0% * DGD)
• Resolution 0.1 nm ± (30 fs + 3.0% * DGD)
• DGD measurement range 0 ps to 1000 ps
• PMD uncertainty ± (30 fs + 2.0% * DGD)
• PMD repeatability (typical) ± 3 fs
• PMD measurement range 0 ps to 300 ps

Loss

• PDL uncertainty
• 5 C-Band ± (0.05 dB + 4% * PDL)
• O-Band ± (0.10 dB + 4% * PDL)
• PDL repeatability (typical) ± 0.005 dB
• Insertion loss uncertainty (typical)
• C/L-Band ± 0.03 dB
• O-Band ± 0.07 dB
• Insertion loss dynamic range (typical) > 41 dB (for higher TLS power levels, increase value accordingly)

Polarization analysis

• SOP uncertainty (typical) 1.5°
• DOP uncertainty ± 2.0 %
• DOP uncertainty after user calibration (typical) ± 0.5 %
• Maximum sampling rate 1 MHz

Optical power measurement

• Relative power uncertainty
• C/L-Band: ± -.03 dB (± 0.02 dB typical)
• O-Band: ± 0.07 dB (± 0.04 dB typical)
• Input power range -50 dBm to +7 dBm
• Maximum safe optical input power +12 dBm

Polarization control

• SOP switching time < 10 μs
• PDL (typical)
• C/L-Band < 0.2 dB
• O-Band < 0.5 dB
• Insertion loss < 3.5 dB (< 3 dB, typical)
• Maximum safe input power +20 dBm