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RENT KEYSIGHT B1505A (AGILENT) Analyzer / Curve Tracer (call for availability)
The Keysight B1505A (Agilent) Power Device Analyzer / Curve Tracer is the only single box solution available today with the capability to characterize high power devices from the sub-picoamp level up to 3000 volts and 20 amps. This capability covers evaluation for new power devices using wide band gap materials such as silicon carbide (SiC) or gallium nitride (GaN). The Keysight B1505A (Agilent) has separate modules that support high-current (HCSMU) and high-voltage (HVSMU). The B1505A also supports a high-power SMU (up to 1 A/200 V) and a multi-frequency capacitance measurement unit (up to 5 MHz). Its ten-slot modular construction lets you configure the B1505A exactly the way you want.
The Agilent B1505A Analyzer / Curve Tracer software environment allows users to check device characteristics and detect device faults with the easy convenience of a curve tracer. Just like on a curve tracer, the B1505A supports rotary knob control of the independent sweep variable for intuitive and real-time evaluation of parameters such as breakdown voltage. The measurement setup information and data can be automatically stored to the B1505A's built-in hard disk drive and transferred to USB memory sticks as well as other portable storage devices. It is also easy to print graphical measurement data and to copy and paste it into reports when the analysis results are summarized.
A proper test fixture solution is extremely important, both to insure safety (due to the high voltages and currents used) and to support the wide variety of power device package types. A previous limitation of curve tracers was that some power devices could not be evaluated due to their size, or it was necessary to jury-rig an adapter in order to test the device. However, the B1505A's test fixture can accept a wide variety of devices, such as power MOSFETs, diodes and IGBTs, regardless of their size or shape via a large fixture adapter with customizable fixture modules. In addition, the test fixture's built-in interlock mechanism ensures that high voltages and currents can be applied to test devices safely.
Power devices, including power management ICs (PMIC) and power MOSFETs and motor control ICs used in cars, are a growing device category that requires both high-power and high-accuracy test. In order to meet emerging standards for low-carbon emissions and improved energy efficiencies, power devices must function more efficiently even as they continue to become more complex, smaller and faster. New devices using wide band gap materials such as silicon carbide (SiC) or gallium nitride (GaN) have been widely studied in order to achieve high efficiency. To enable the careful and precise testing to meet performance and safety requirements, these studies require high-voltage measurement capabilities greater than 1,000V. In addition, for those power-device developments, on-wafer testing becomes very important for reducing development turnaround times.
|Module||Required Slots||Main Specifications|
|B1510A HPSMU||2||Up to 200 V, 1 A force. 10 fA current resolution|
|B1512A HCSMU||2||20 A/20 V (Pulsed); 1 A/40 V (DC)|
|B1513A HVSMU||2||1500 V/8 mA; 3000 V/4 mA; (Pulsed & DC)|
|B1520A MFCMU||1||1 kHz to 5 MHz, up to 3000 V DC bias using bias-T|
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