Keithley 4200A-SCS
Semiconductor Parameter Analyzer Characterization System

Download Product Datasheet

Available Option Configurations

Config-04

• 4200-PA - Remote Preamp
• 4210-CVU - Capacitance Voltage Unit 1Khz-10Mhz
• 4X 4200-SMU - Four 4200-SMU Medium Power SMU Cards
• MSRP: $90,450 | Available for Rental    GET QUOTE  

Product Overview

KEITHLEY 4200A-SCS

The Keithley 4200A-SCS Semiconductor Parameter Analyzer Characterization System performs lab grade DC and pulse device characterization, real-time plotting, and analysis with high precision and sub-fem to amp resolution. The Keithley 4200A-SCS delivers synchronizing current-voltage (I-V), capacitance-voltage (C-V) and ultra-fast pulsed I-V measurements.

The Keithley 4200A-SCS Parameter Analyzer reduces characterization complexity and test setup by up to 50%, providing clear, uncompromised measurement and analysis capability. Plus, embedded measurement expertise—an industry first—provides test guidance and gives you supreme confidence in your results.

Highlights of the Keithley 4200A-SCS Semiconductor Parameter Analyzer include:

• Built-in measurement VIDEOS in English, Chinese, Japanese, and Korean
• Jump start your testing with over 450 user-modifiable application tests
• Automated real-time parameter extraction, data graphing, arithmetic functions
• The 4200A-CVIV Multi-Switch automatically switches between I-V and C-V measurements without re-cabling or lifting the prober tips. Unlike competing products, the four-channel 4200A-CVIV display provides local visual insight for quick test setup and easy troubleshooting when unexpected results occur.
• Move C-V measurement to any device terminal without re-cabling
• User-configurable for low current capability
• Personalize the names of output channels
• View real-time test status

Features of the Keithley 4200A-SCS system include:

• Intuitive, touch-screen interface running Clarius SWon Win7 embedded computer.
• Unique Optional Remote PreAmps extend the resolution of SMUs to 10 aA 
• C-V instrument makes C-V measurements as easy as DC I-V
• Pulse and pulse I-V capabilities for advanced semiconductor testing
• Scope card provides integrated scope and pulse measure functionality
• Self-contained PC provides fast test setup, powerful data analysis, graphing and printing, and on-board mass storage of test results.  
• Furnished with embedded measurement expertise and hundreds of ready-to-use application tests,
• Built-in stress/measure, looping, and data analysis for point-and-click reliability testing, including five JEDEC compliant sample tests
• Integrated support for a variety of LCR meters, Keithley switch matrix configurations, and both Keithley Series 3400 and Agilent 81110 pulse generators
• Includes software drivers for leading analytical probers

SPecifications of the 4200A-SCS include:

• Current-Voltage (I-V) Range: 
• 0.1 fA – 1 A
• 0.2 µV – 210 V
• Capacitance-Voltage (C-V) Range: 1 kHz – 10 MHz ± 30V DC bias
• Pulsed I-V Range: ±40 V (80 V p-p), ±800 mA 200 MSa/sec, 5 ns sampling rate