Microchip (Microsemi) 5125A
Phase Noise and Allan Deviation Test Set, 1 - 400 MHz

Analyzers >> Phase Noise and Noise Figure Analyzers >> Phase Noise and Allan Deviation Test Set, 1 - 400 MHz
Rent Used Test Equipment

Manufacturer: Microchip (Microsemi)
Model: 5125A

Microchip (Microsemi) 5125A Phase Noise and Allan Deviation Test Set, 1 - 400 MHz

Electronic Test and Measurement Equipment

Download Product Datasheet
Rent Test Equipment

Product Overview

RENT Microsemi 5125A (call to schedule availability)

The Microsemi 5125A Phase Noise and Allan Deviation (ADEV) Test Set with Ultra Low Noise Floor transforms the way these measurements are made. Traditional measurement instruments require an external phase-lock loop, turning these types of measurements into a complicated and costly endeavor. Compare this with the 5125A, which makes fast yet accurate single sideband (SSB) phase noise and ADEV measurements at the click of a button, all at a fraction of the cost of alternative solutions.

The 5125A employs both direct sampling of the RF waveforms as well as cross correlation, making it possible to easily characterize the highest performance time and frequency references. The third generation, all-digital 5125A has been designed to meet the most demanding requirements. The 5125A can measure phase noise down to -145 dBc/Hz at 1 Hz offset from a 10 MHz carrier and -130 dBc/Hz at 1 Hz offset from a 100 MHz carrier, making it the perfect solution to characterize the very low noise frequency references, such as those used in RADAR and satellite communications.

Microsemi’s 5125A is the easiest to use phase noise and ADEV test set in the world: simply connect the device under test (DUT) and reference signal (which can be at a different frequency than the DUT) and press the 5125A’s green Start button. Seconds later valid measurement data appears on the unit’s high resolution display. With the all-digital 5125A, tedious multi-step configuration and calibration routines are no longer required.

The Microsemi 5125A provides phase noise measurement accuracy to previously impossible levels of ±1.0 dB. This combined with the best-in-industry phase noise and ADEV measurement floor means that with the 5125A you can characterize even your lowest noise references more accurately than ever before.

The 5125A is able to support the widest range of phase noise and ADEV measurements of any commercially available product. By converting the DUT and Reference signals to their digital representation as a first step, the patented all-digital design in the 5125A has eliminated the need for carrier suppression when making measurements, enabling phase noise measurements at smaller frequency offsets than previously possible (to below 0.1 mHz).

Features of the Microsemi 5125A include:

Simultaneous phase noise and Allan Dviation measurements
1 - 400 MHz input frequency range
No external data processing required
Industry leading accuracy
Allan Deviation measurements to over 300 days
Phase noise measurements as close as 0.1 MHz from the carrier
Displays internal noise estimate
Excellent phase noise measurements down to -170 dBc/Hz (typical) 10 kHz from the carrier (10 MHz input)

Specifications of the Microsemi 5125A include:

Performance:
- Frequency range: 1-400 MHz (sinewave)
- Allan deviation:
Phase Noise Specifications:
- Measurement accuracy: ±1.0 dB
- Offset frequency range: 0.1 mHz to 1 MHz
- System noise floor: ∠(f) dBc/Hz
  - Offset 10 MHz / 100 MHz /400 MHz
    
    1 Hz -140 / -120 / -110
    10 Hz -150 / -130 / -120
    100 Hz -157 / -140 / -130
    1 kHz -162 / -150 / -140
    10kHz -140 / -120 / -110
    >100 kHz -150 / -130 / -120

- System noise floor (typical): ∠(f) dBc/Hz
  - Offset 10 MHz / 100 MHz / 400 MHz
    
    1 Hz -145 / -130 / -116
    10 Hz -155 / -140 / -126
    100 Hz -160 / -150 / -136
    1 kHz -165 / -160 / -146
    10kHz -170 / -170 / -156
    >100 kHz -170 / -170 / -162

- ELECTRICAL SPECIFICATIONS
  - nput signal level: 3-17 dBm
  - Input impedance: 50W
  - Input connectors: TNC (supplied with two BNC adapters)

REQUEST A QUOTE

Testimonials

I thought of no place else to try first but you.

-- Tony
Fremont, CA

Customers who viewed this also viewed

Microchip (Microsemi) 53100A Phase Noise and Allan Deviation Tester, 1 to 200 MHz

Why Choose Axiom? Your testing is complicated enough, we want to make sourcing test equipment the easy part.
	Dedicated Customer Service We go beyond the role of order taker & strive to partner with you to provide a custom solution.	Competitive Prices Equipment is agressively priced. We work with you to find a solution to fit your budget.
	Fast Turnaround No long drawn-out sales process, We help you find the equipment you need, and get through order processing quickly so your equipment ships out fast!	Warranty & Support Comprehensive Parts and Labor warranty on all equipment sold. Includes a user manual, is fully accessorized, and tested to manufacturer specifications prior to shipment.

Microchip (Microsemi) 5125APhase Noise and Allan Deviation Test Set, 1 - 400 MHz

Product Overview

REQUEST A QUOTE

Customers who viewed this also viewed

Why Choose Axiom?

Microchip (Microsemi) 5125A
Phase Noise and Allan Deviation Test Set, 1 - 400 MHz