The Agilent E5503B phase noise measurement solution simplifies ATE test times for one-port VOC's, DROs, crystal oscillators and synthesizers and maximizes capability for R& D benchtop applications. In addition, with a standard offset range capability from 0.01 Hz to 100 MHz, the Agilent E5503B provides the capability, flexibility and versatility to meet changing and demanding needs placed upon the R&D engineer. By building upon 30 years of Agilent Technologies low phase noise, RF design and measurement experience, the Agilent E5503B solution continues to provide excellent measurement integrity, repeatability and accuracy. The Agilent E5503B phase noise measurement solution has been designed to simplify phase noise measurements of one-port VCOs, DROs, crystal oscillators, and synthesizers and to maximize the capability for R&D benchtop applications. The Agilent E5503B solution continues to provide excellent measurement integrity, repeatability and accuracy.
Other features and specifications include:
Testimonials |
I just wanted to say thank you. You guys are constantly dealing with our outrageous (and sometimes off the wall) demands and requests with the upmost care and professionalism. You guys are quick and give a level of quality that you dont often see, it is refreshing and a wonderful feeling to know that you guys have our backs. -- Tony B. Carlsbad, CA |
Customers who viewed this also viewed | |||
Microchip (Microsemi) 53100A Phase Noise and Allan Deviation Tester, 1 to 200 MHz
|