SyntheSys Research BSA17500CSI
BERTScope 17.5 Gb/s Pattern Generator and Error Analyzer

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Product Overview

SyntheSys Research BSA17500CSi

The SyntheSys Research BERTScope 17500CSi advanced the BERTScope Family to 17.5 Gb/s and covers today’s serial data interfaces from 1Gb Ethernet (GbE) to 10 GbE and are designed to address future serial data interfaces including:

• 16x Fibre Channel
• 12 Gb/s SAS
• 8.0 GT/s Gen. 3 PCI Express®
• Potential 16.0 GT/s Gen. 4 PCI Express
• Proprietary chip interfaces
• Next Generation Backplanes

Specifications and features of the BSA17500CSI BERTScope include:

• BER analysis with patented error location analysis
• BER correlated eye diagram & mask testing
• MJSQ1 compliant dual-Dirac based Jitter Peak analysis
• Q-Factor BER-based view of vertical eye openingBER contour analysis with contour compliance masktesting for compliance masks specified at deep BER levels
• Automated jitter tolerance compliance and margin testing
• Jitter Map, available as an option, performs jitter decomposition using BER based measurements, including on jitter separation on long patterns such as PRBS-31.
• FIR Explorer, easily converts insertion loss measurements into FIR tap settings for emulation or correction.
• Rear panel differential reference clock outputs and single ended reference clock input at seven selectable frequencies; these may be used to phase lock a BERTScope to another BERTScope or other external instrument.
• Windows XP for better web security and compatibility with local IT policies.
• 128Mb RAM memory enables the use and capture of extremely long stress patterns.
• USB port count increased from two to four

The BERTScope 17500CSi provides rear panel differential reference clock outputs and single ended reference clock input which can be used to phase lock to the BSA. The rear panel reference clocks frequencies are:

• 10 MHz
• 100 MHz
• 106.25 MHz
• 133.33 MHz
• 156.25 MHz
• 166.67 MHz
• 200 MHz

The SyntheSys Research BERTScope 17500CSi includes:

• pattern generation
• error detection
• eye diagram analysis and Mask Testing
• Physical Layer Analysis
• Error Correction
• Coding and Mapping
• Enhanced stress generation with added SJ range 
• SSC capability
• Automated jitter tolerance testing

Additional options include:

• Jitter Map
• PatternVu Equalization Processing
• PCIe stress generation
• F/2 jitter generation
• Live Data Analysis