Tektronix 80E04
Dual Channel Sampling Module w/ TDR, 20 GHz

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Product Overview

RENT TEKTRONIX 80E04 Dual Channel Sampling Module (Call for Availability)

The Tektronix 80E04 are dual-channel Time Domain Reflectometry (TDR) sampling modules, providing up to 12 ps incident and 23 ps reflected rise time.  Each channel of these modules can generate a fast step for use in TDR mode and the acquisition portion of the sampling module monitors the incident step and any reflected energy. The polarity of each channel's step can be selected independently. This allows for differential or common mode TDR or S-parameter testing of two coupled lines, in addition to the independent testing of isolated lines. The independent step generation for each channel allows true differential measurements, which ensures measurement accuracy for differential devices. 

All modules have independent incident step and receiver deskew to remove the effect of measurement fixtures and probes, enabling faster and easier de-embedding of test fixtures. The Tektronix 80E04 sampling modules provide an acquisition rise time of 7 ps, with up to 20 GHz selectable equivalent bandwidth. Using Tektronix IConnect® TDR and VNA software with these modules enables acquiring up to 1,000,000 data points and obtaining up to 20 GHz differential, mixed mode, and single-ended S-parameters. IConnect also enables impedance, S-parameters, and eye-diagram compliance testing as required by various serial data standards, and full channel analysis, Touchstone (SnP) file output, and SPICE modeling for gigabit interconnects.

Specifications for the TEKTRONIX 80E04 Dual Channel Sampling Module Include:

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